Resistance switching and memory effects in solution-processed BiFeO₃/LaNiO₃ junctions

Author： Pandya N C Debnath A K Joshi U S

E-ISSN： 1361-6463|49|5|55301-55307

ISSN： 0022-3727

Source： Journal of Physics D: Applied Physics, Vol.49, Iss.5, 2016-02, pp. : 55301-55307

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