Probing weak localization in chemical vapor deposition graphene wide constriction using scanning gate microscopy

Author： Chuang C Matsunaga M Liu F-H Woo T-P Aoki N Lin L-H Wu B-Y Ochiai Y Liang C-T

E-ISSN： 1361-6528|27|7|75601-75607

ISSN： 0957-4484

Source： Nanotechnology, Vol.27, Iss.7, 2016-02, pp. : 75601-75607

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