Experimental research on transient radiation effects in microprocessors based on SPARC-V8 architecture

Author: Yuanfu Zhao   Hongchao Zheng   Long Fan   Suge Yue   Maoxin Chen   Shougang Du  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.36, Iss.11, 2015-11, pp. : 114008-114012

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Abstract