Author： Pan Jeh-Nan Li Chung-I Shih Wei-Chen
Publisher： Emerald Group Publishing Ltd
E-ISSN： 1758-6682|33|1|42-61
ISSN： 0265-671X
Source： International Journal of Quality & Reliability Management, Vol.33, Iss.1, 2016-01, pp. : 42-61
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