In situ high P‐T X ray diffraction studies on three polymorphs (α, β, γ) of Mg2SiO4
Publisher: John Wiley & Sons Inc
E-ISSN: 2156-2202|98|B12|22199-22207
ISSN: 0148-0227
Source: Journal Of Geophysical Research, Vol.98, Iss.B12, 1993-12, pp. : 22199-22207
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Abstract