In situ high P‐T X ray diffraction studies on three polymorphs (α, β, γ) of Mg2SiO4

Publisher: John Wiley & Sons Inc

E-ISSN: 2156-2202|98|B12|22199-22207

ISSN: 0148-0227

Source: Journal Of Geophysical Research, Vol.98, Iss.B12, 1993-12, pp. : 22199-22207

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Abstract