Defect Detection Approach Based on Combination of Histogram Segmentation and Probabilistic Estimation Technique

E-ISSN： 2155-6989|1|4|19-26

ISSN： 2155-6997

Source： International Journal of Computer Vision and Image Processing (IJCVIP), Vol.1, Iss.4, 2011-10, pp. : 19-26

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