Publisher: John Wiley & Sons Inc
E-ISSN: 1541-0420|72|1|253-261
ISSN: 0006-341x
Source: BIOMETRICS, Vol.72, Iss.1, 2016-03, pp. : 253-261
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Regression analysis of correlated ordinal data using orthogonalized residuals
By Perin J. Preisser J. S. Phillips C. Qaqish B.
Biometrics, Vol. 70, Iss. 4, 2014-12 ,pp. :
The stochastic community and the logistic-J distribution
By Dewdney A.K.
Acta OEcologica, Vol. 24, Iss. 5, 2003-12 ,pp. :