Publisher: Trans Tech Publications
E-ISSN: 1662-9752|2016|858|821-824
ISSN: 0255-5476
Source: Materials Science Forum, Vol.2016, Iss.858, 2016-06, pp. : 821-824
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
High Temperature Nitridation of 4H-SiC MOSFETs
Materials Science Forum, Vol. 2016, Iss. 858, 2016-06 ,pp. :
The Influence of Surface Pit Shape on 4H-SiC MOSFETs Reliability under High Temperature Bias Tests
Materials Science Forum, Vol. 2016, Iss. 858, 2016-06 ,pp. :
Materials Science Forum, Vol. 2016, Iss. 858, 2016-06 ,pp. :