Effect of Annealing Temperature on NiO/ZnO Heterojunction Thin Films Prepared by Sol-Gel Method

Publisher: Trans Tech Publications

E-ISSN: 1662-9795|2016|675|225-228

ISSN: 1013-9826

Source: Key Engineering Materials, Vol.2016, Iss.675, 2016-02, pp. : 225-228

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract