Physical Insights on Charge Transport Mechanism and the LF Noise Behavior in Oxidized Si Structures with Ge Nanoclusters

Publisher： Trans Tech Publications

E-ISSN： 1661-9897|2016|39|105-113

ISSN： 1662-5250

Source： Journal of Nano Research, Vol.2016, Iss.39, 2016-03, pp. : 105-113

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