Photoelectric Phenomena and Photoelectric Characterization Methods of the MOS System - Basics and New Developments

Publisher: Trans Tech Publications

E-ISSN: 1661-9897|2016|39|69-79

ISSN: 1662-5250

Source: Journal of Nano Research, Vol.2016, Iss.39, 2016-03, pp. : 69-79

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Abstract