

Publisher: Trans Tech Publications
E-ISSN: 1662-9752|2016|852|774-781
ISSN: 0255-5476
Source: Materials Science Forum, Vol.2016, Iss.852, 2016-05, pp. : 774-781
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content


High CEC generation and surface modification in mica and vermiculite minerals
By Mittal Vikas
Philosophical Magazine, Vol. 93, Iss. 7, 2013-03 ,pp. :




By Liu H. Imad-Uddin Ahmed S. Scherge M.
Thin Solid Films, Vol. 381, Iss. 1, 2001-01 ,pp. :




Study on Surface Modification of Micaceous Iron Oxide
Materials Science Forum, Vol. 2016, Iss. 852, 2016-05 ,pp. :