High resolution selective reflection spectroscopy as a probe of long-range surface interaction : measurement of the surface van der Waals attraction exerted on excited Cs atoms

Publisher： Edp Sciences

E-ISSN： 1286-4870|2|4|631-657

ISSN： 1155-4312

Source： Journal de Physique II, Vol.2, Iss.4, 1992-04, pp. : 631-657

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