Radiation Effects in Thin-Film Ferroelectric PZT for Non-Volatile Memory Applications in Microelectronics

E-ISSN： 1286-4897|7|6|1227-1243

ISSN： 1155-4320

Source： Journal de Physique III, Vol.7, Iss.6, 1997-06, pp. : 1227-1243

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