Ultrafast Optical Measurements of Defect Creation in Laser Irradiated SiO2

Publisher: Edp Sciences

E-ISSN: 1286-4897|6|12|1647-1676

ISSN: 1155-4320

Source: Journal de Physique III, Vol.6, Iss.12, 1996-12, pp. : 1647-1676

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next