In-Situ Survey System of Resistive and Thermoelectric Properties ofEither Pure or Mixed Materials in Thin Films Evaporated Under Ultra HighVacuum

Publisher： Edp Sciences

E-ISSN： 1286-4897|5|4|409-418

ISSN： 1155-4320

Source： Journal de Physique III, Vol.5, Iss.4, 1995-04, pp. : 409-418

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