![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Publisher: Edp Sciences
E-ISSN: 1286-4897|4|9|1573-1580
ISSN: 1155-4320
Source: Journal de Physique III, Vol.4, Iss.9, 1994-09, pp. : 1573-1580
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Characterization of roughness correlations in W/Si multilayers by diffuse x-ray scattering
Le Journal de Physique IV, Vol. 04, Iss. C9, 1994-11 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
The theory of liquids and the prediction of diffuse X-ray scattering.
Journal de Physique et le Radium, Vol. 16, Iss. 5, 1955-05 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
X-ray diffuse scattering and molecular dynamics in proteins
Le Journal de Physique IV, Vol. 04, Iss. C9, 1994-11 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
High resolution X-ray scattering studies of substrates and multilayers
Revue de Physique Appliquée (Paris), Vol. 23, Iss. 10, 1988-10 ,pp. :