X-ray reflectometry investigation of interfacial structure of CrAlN/TiAlN multilayers

Publisher: Cambridge University Press

E-ISSN: 2159-6867|6|4|408-415

ISSN: 2159-6859

Source: MRS Communications, Vol.6, Iss.4, 2016-09, pp. : 408-415

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content