Double-tip piezoresponse force microscopy for quantitative measurement of the piezoelectric coefficient at the nanoscale

Author： Pan K.   Liu Y. M.   Peng J. L.   Liu Y. Y.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|104|6|67001-67001

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.104, Iss.6, 2013-12, pp. : 67001-67001

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