Determining the electron-phonon coupling strength from Resonant Inelastic X-ray Scattering at transition metal L-edges

Author： Ament L. J. P.   van Veenendaal M.   van den Brink J.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|95|2|27008-27008

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.95, Iss.2, 2011-07, pp. : 27008-27008

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