Measuring nanoscale stress intensity factors with an atomic force microscope

Author: Han K.   Ciccotti M.   Roux S.  

Publisher: Edp Sciences

E-ISSN: 1286-4854|89|6|66003-66003

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.89, Iss.6, 2010-04, pp. : 66003-66003

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Abstract