Direct micro-imaging of point defects in bulk SiO2, applied to vacancy diffusion and clustering

Author： Suhovoy E.   Mishra V.   Shklyar M.   Shtirberg L.   Blank A.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|90|2|26009-26009

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.90, Iss.2, 2010-05, pp. : 26009-26009

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