Scaling and universality in the kinetic smoothening of interfaces: Application to the analysis of the relaxation of rough vicinal steps of an oxide surface

Author: Nguyen T. T. T.   Bonamy D.   Phan Van L.   Cousty J.   Barbier L.  

Publisher: Edp Sciences

E-ISSN: 1286-4854|89|6|60005-60005

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.89, Iss.6, 2010-04, pp. : 60005-60005

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Abstract