Ellipsometric microscopy

Author: Neumaier K. R.   Elender G.   Sackmann E.   Merkel R.  

Publisher: Edp Sciences

E-ISSN: 1286-4854|49|1|14-19

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.49, Iss.1, 2010-03, pp. : 14-19

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Abstract