Simulations of an electromigration-induced edge instability in single-crystal metal lines

Author： Mahadevan M. Bradley R. M. Debierre J.-M.

E-ISSN： 1286-4854|45|6|680-685

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.45, Iss.6, 2010-03, pp. : 680-685

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