Imaging of stored charges in Si quantum dots by tapping and electrostatic force microscopy

Author： Guillemot C.   Budau P.   Chevrier J.   Marchi F.   Comin F.   Alandi C.   Bertin F.   Buffet N.   Wyon Ch.   Mur P.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|59|4|566-571

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.59, Iss.4, 2010-03, pp. : 566-571

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