Mössbauer study of the proximity gettering of ion-implanted $\rm {}^{57}Co$ impurities byB-Si precipitates in Si

Author： Deweerd W.   Koops G.   Pattyn H.   Myers S. M.   Aselage T. L.   Headley T. J.   Petersen G. A.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|44|6|707-713

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.44, Iss.6, 2010-03, pp. : 707-713

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