Two-layer behaviour during low-energy ion ablation of CdTe(001) studied by in situ X-ray diffraction and by Monte Carlo simulation

Author： Etgens V. H.   Ribeiro-Teixeira R. M.   Mors P. M.   Veron M. B.   Tatarenko S.   Sauvage-Simkin M.   Alvarez J.   Ferrer S.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|36|4|271-276

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.36, Iss.4, 2010-03, pp. : 271-276

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