Scanning force microscopy corrected for $\chem{nm}$-scale sample elasticity on single latent heavy-ion tracks in polymers

Author： Ohnesorge F.   Neumann R.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|50|6|742-748

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.50, Iss.6, 2010-03, pp. : 742-748

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