Determination of micrometer length scales with an X-ray reflectionultra small-angle scattering set-up

Author： Müller-Buschbaum P.   Casagrande M.   Gutmann J.   Kuhlmann T.   Stamm M.   von Krosigk G.   Lode U.   Cunis S.   Gehrke R.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|42|5|517-522

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.42, Iss.5, 2010-03, pp. : 517-522

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