Pressure dependence of dynamical and dielectric properties of 3C and 4H silicon carbide

Author: Karch K.   Bechstedt F.  

Publisher: Edp Sciences

E-ISSN: 1286-4854|35|3|195-200

ISSN: 0295-5075

Source: EPL (EUROPHYSICS LETTERS), Vol.35, Iss.3, 2010-03, pp. : 195-200

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Abstract