Evidence of 3D-XY critical behaviour in La2-xSrxCuO4 films

Author： Jaccard Y.   Schneider T.   Locquet J.-P.   Williams E. J.   Martinoli P.   Fischer Ø.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|34|4|281-286

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.34, Iss.4, 2010-03, pp. : 281-286

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