Comparison of spatial point patterns and processes characterization methods

Author： Wallet F.   Dussert C.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|42|5|493-498

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.42, Iss.5, 2010-03, pp. : 493-498

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