Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers

E-ISSN： 1435-8115|23|2|321-328

ISSN： 1431-9276

Source： Microscopy and Microanalysis, Vol.23, Iss.2, 2016-10, pp. : 321-328

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography

Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-02 ,pp. : 194-209

Cambridge University Press

Access to resources Recommend Favorite

Understanding of Capping Effects on the Tip Shape Evolution and on the Atom Probe Data of Bulk LaAlO₃ Using Transmission Electron Microscopy

Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-02 ,pp. : 329-335

Cambridge University Press

Access to resources Recommend Favorite

Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries

Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-02 ,pp. : 291-299

Cambridge University Press

Access to resources Recommend Favorite

Reflections on the Projection of Ions in Atom Probe Tomography

Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-02 ,pp. : 238-246

Cambridge University Press

Access to resources Recommend Favorite

Nanoscale Stoichiometric Analysis of a High-Temperature Superconductor by Atom Probe Tomography

Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-01 ,pp. : 414-424

Cambridge University Press

Access to resources Recommend Favorite