Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)

Publisher: Cambridge University Press

E-ISSN: 1435-8115|23|3|460-471

ISSN: 1431-9276

Source: Microscopy and Microanalysis, Vol.23, Iss.3, 2017-03, pp. : 460-471

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Abstract