Transcatheter closure of secundum atrial septal defects: has fear of device erosion altered outcomes?
Publisher: Cambridge University Press
E-ISSN: 1467-1107|27|6|1153-1161
ISSN: 1047-9511
Source: Cardiology in the Young, Vol.27, Iss.6, 2017-01, pp. : 1153-1161
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