Focused Ion Beam Preparation of Specimens for Micro-Electro-Mechanical System-based Transmission Electron Microscopy Heating Experiments

Publisher： Cambridge University Press

E-ISSN： 1435-8115|23|4|708-716

ISSN： 1431-9276

Source： Microscopy and Microanalysis, Vol.23, Iss.4, 2017-06, pp. : 708-716

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