Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive Polymers

Publisher： Cambridge University Press

E-ISSN： 1435-8115|23|4|872-877

ISSN： 1431-9276

Source： Microscopy and Microanalysis, Vol.23, Iss.4, 2017-05, pp. : 872-877

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