Publisher: Nova Science Publishers, Inc.
ISSN: 1083-4729
Source: Journal of Magnetohydrodynamics, Plasma, and Space Research, Vol., Iss., 2016-01, pp. : 98-98
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics∗
By CHANDRA P.
Ferroelectrics, Vol. 313, Iss. 1, 2004-01 ,pp. :
Measurement of thin film thickness during their vacuum formation
Journal de Physique Appliqué, Vol. 21, Iss. S11, 1960-11 ,pp. :
A COMPUTER INTEGRATED SPECTROPHOTOMETER FOR FILM THICKNESS MONITORING
Le Journal de Physique Colloques, Vol. 44, Iss. C10, 1983-12 ,pp. :