Analysis of powder diffraction data collected with synchrotron X-ray and multiple 2D X-ray detectors applying a beta-distribution peak profile model

Publisher： Cambridge University Press

E-ISSN： 1945-7413|32|S1|S172-S178

ISSN： 0885-7156

Source： Powder Diffraction, Vol.32, Iss.S1, 2017-09, pp. : S172-S178

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