Probing and Manipulating the Interfacial Defects of InGaAs Dual‐Layer Metal Oxides at the Atomic Scale

E-ISSN： 1521-4095|30|2|adma.201703025-adma.201703025

ISSN： 0935-9648

Source： ADVANCED MATERIALS, Vol.30, Iss.2, 2018-01, pp. : n/a-n/a

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