

Publisher: John Wiley & Sons Inc
E-ISSN: 1862-6270|12|1|pssr.201700333-pssr.201700333
ISSN: 1862-6254
Source: PHYSICA STATUS SOLIDI - RAPID RESEARCH LETTERS (ELECTRONIC), Vol.12, Iss.1, 2018-01, pp. : n/a-n/a
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Previous Menu Next
Abstract
Related content


Micromechanical measurements of ion-beam treated steel
By Jagielski J. Piatkowska A. Rymuza Z. Kusznierewicz Z. Treheux D. Boutard D. Thome L. Gawlik G.
Wear, Vol. 238, Iss. 1, 2000-03 ,pp. :




High current density ion-beam extraction
By Kondrashev S. Balabaev A. Zorin V. Sidorov A.
Radiation Effects and Defects in Solids, Vol. 160, Iss. 10-12, 2005-10 ,pp. :


Fabrication of Silicon/Germanium superlattice by ion-beam sputtering
By Sasaki K. Takahashi Y. Ikeda T. Hata T.
Vacuum, Vol. 66, Iss. 3, 2002-08 ,pp. :