Investigation of Surface Sulfurization in CuIn1−xGaxS2−ySey Thin Films by Using Kelvin Probe Force Microscopy

Publisher: John Wiley & Sons Inc

E-ISSN: 1439-7641|19|3|261-265

ISSN: 1439-4235

Source: CHEMPHYSCHEM, Vol.19, Iss.3, 2018-02, pp. : 261-265

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Abstract