High concentration measurements of U and Pu with nondestructive and standardless K‐edge densitometer device

Publisher: John Wiley & Sons Inc

E-ISSN: 1097-4539|47|2|186-186

ISSN: 0049-8246

Source: X-RAY SPECTROMETRY, Vol.47, Iss.2, 2018-03, pp. : 186-186

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