Publisher: John Wiley & Sons Inc
E-ISSN: 1521-4095|30|4|adma.201704543-adma.201704543
ISSN: 0935-9648
Source: ADVANCED MATERIALS, Vol.30, Iss.4, 2018-01, pp. : n/a-n/a
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Previous Menu Next
Abstract
Related content
Atomic-Scale Defects in Silicon Carbide for Quantum Sensing Applications
Materials Science Forum, Vol. 2015, Iss. 821, 2015-07 ,pp. :