The Development of a High Rate Tensile Testing System for Micro Scaled Single Crystal Silicon Specimens

Author： Dubelman S.   Raghunathan N.   Peroulis D.   Chen W.  

Publisher： Springer Publishing Company

ISSN： 0014-4851

Source： Experimental Mechanics, Vol.54, Iss.3, 2014-03, pp. : 413-419

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