How to best measure atomic segregation to grain boundaries by analytical transmission electron microscopy

Author: Walther T.   Hopkinson M.   Daneu N.   Recnik A.   Ohno Y.   Inoue K.   Yonenaga I.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.49, Iss.11, 2014-06, pp. : 3898-3908

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