Interactive overlay maps for US patent (USPTO) data based on International Patent Classification (IPC)

Author： Leydesdorff Loet   Kushnir Duncan   Rafols Ismael  

Publisher： Springer Publishing Company

ISSN： 0138-9130

Source： Scientometrics, Vol.98, Iss.3, 2014-03, pp. : 1583-1599

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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