Use of atomic force microscopy (AFM) to explore cell wall properties and response to stress in the yeast Saccharomyces cerevisiae

Author： Francois Jean Formosa Cécile Schiavone Marion Pillet Flavien Martin-Yken Hélène Dague Etienne

Publisher： Springer Publishing Company

ISSN： 0172-8083

Source： Current Genetics, Vol.59, Iss.4, 2013-11, pp. : 187-196

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