Structural defect-dependent resistive switching in Cu-O/Si studied by Kelvin probe force microscopy and conductive atomic force microscopy

Publisher： IOP Publishing

E-ISSN： 1361-6528|26|34|345702-345710

ISSN： 0957-4484

Source： Nanotechnology, Vol.26, Iss.34, 2015-01, pp. : 345702-345710

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

By Kou Lili Naitoh Yoshitaka Komiyama Masaharu Sugawara Yasuhiro Kou Lili Kou Lili

Nanotechnology, Vol. 26, Iss. 19, 2015-05 ,pp. : 195701-195707

IOP Publishing

Access to resources Recommend Favorite

Nanoscale multilevel switching in Ge2Sb2Te5 thin film with conductive atomic force microscopy

By Yang Fei Xu Ling Chen Jing Xu Jun Yu Yao Chen Kunji Yang Fei

Nanotechnology, Vol. 27, Iss. 3, 2016-01 ,pp. : 35706-35712

IOP Publishing

Access to resources Recommend Favorite

Study of charge separation and interface formation in a single nanorod CdS-Cu x S heterojunction solar cell using Kelvin probe force microscopy

By Gupta Saatviki Batra Yogita Mehta B.R. Satsangi V.R.

Nanotechnology, Vol. 24, Iss. 25, 2013-06 ,pp. : 255703-255709

IOP Publishing

Access to resources Recommend Favorite

Oxidation of Langmuir-Blodgett films of monounsaturated lipids studied by atomic force microscopy

By Faye Ndeye Rokhaya Moroté Fabien Grauby-Heywang Christine Cohen-Bouhacina Touria

International Journal of Nanotechnology, Vol. 10, Iss. 5-7, 2013-04 ,pp. : 390-403

Inderscience Publishers

Access to resources Recommend Favorite

Shape-dependent adhesion and friction of Au nanoparticles probed with atomic force microscopy

Nanotechnology, Vol. 26, Iss. 13, 2015-03 ,pp. : 135707-135713

IOP Publishing

Access to resources Recommend Favorite